Scanning AC nanocalorimetry study of Zr/B reactive multilayers

Journal of Applied Physics

Volumn 114, Issue 21, 2013, Pages

  Lee, Dongwoo ^a   Sim, Gi Dong ^a   Xiao, Kechao ^a   Seok Choi, Yong ^a,b   Vlassak, Joost J ^a  

^a HARVARD UNIVERSITY   (United States)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DATA-REDUCTION ALGORITHMS; ELEVATED TEMPERATURE; EXOTHERMIC PEAKS; LOW TEMPERATURES; MODULATION PERIOD; NANOCALORIMETRY; TEM OBSERVATIONS;

PHYSICAL PROPERTIES; PHYSICS;

MULTILAYERS;

EID: 84890109170     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4833572     Document Type: Article

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