In situ high-resolution X-ray photoelectron spectroscopy - Fundamental insights in surface reactions

Surface Science Reports

Volumn 68, Issue 3-4, 2013, Pages 446-487

  Papp, Christian ^a   Steinrück, Hans Peter ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ADSORBATES; ADSORPTION; ATOMIC PHYSICS; BINDING ENERGY; BINDING SITES; ETHYLENE; LIGHT SOURCES; MOLECULAR BEAMS; MOLECULES; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; REACTION INTERMEDIATES; REACTION KINETICS; SPECTROMETERS; SURFACE REACTIONS; SYNCHROTRON RADIATION; X RAYS;

HIGH-RESOLUTION SPECTROMETER; PHOTOIONIZATION CROSS SECTION; SUPERSONIC MOLECULAR BEAM; SURFACE SENSITIVITY; TEMPERATURE PROGRAMMED; THIRD-GENERATION SYNCHROTRON LIGHT SOURCES; VIBRATIONAL FINE STRUCTURE; VIBRATIONAL SIGNATURE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84887972429     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2013.10.003     Document Type: Review

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