Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging

Rapid Communications in Mass Spectrometry

Volumn 27, Issue 24, 2013, Pages 2745-2750

  Kiss, András ^a   Smith, Donald F ^a   Jungmann, Julia H ^a   Heeren, Ron M A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION; BENCHMARKING; IMAGE RESOLUTION; ION SOURCES; MICROSCOPES; OPTICAL SENSORS; SECONDARY EMISSION; SIGNAL TO NOISE RATIO;

C 60; COMPLEX SURFACE; HIGH SPATIAL RESOLUTION; HIGH SPEED IMAGING; HIGH-VOLTAGES; MASS-SPECTROMETRY IMAGING; NEW POSITION; PRIMARY IONS; SECONDARY ION-MASS SPECTROMETRY; TECHNOLOGICAL DEVELOPMENT;

SECONDARY ION MASS SPECTROMETRY;

BRILLIANT GREEN; CHOLESTEROL; FULLERENE C60; FULLERENE DERIVATIVE; QUATERNARY AMMONIUM DERIVATIVE; SODIUM;

ANIMAL; ARTICLE; BAGG ALBINO MOUSE; BRAIN LEVEL; CHEMISTRY; MALE; MASS SPECTROMETRY; METHODOLOGY; MICROSCOPY; MOLECULAR IMAGING; MOUSE; SIGNAL NOISE RATIO;

ANIMALS; BRAIN CHEMISTRY; CHOLESTEROL; FULLERENES; MALE; MICE; MICE, INBRED BALB C; MICROSCOPY; MOLECULAR IMAGING; QUATERNARY AMMONIUM COMPOUNDS; SIGNAL-TO-NOISE RATIO; SODIUM; SPECTROMETRY, MASS, SECONDARY ION;

EID: 84887448198     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.6719     Document Type: Article

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