Microscope mode secondary ion mass spectrometry imaging with a Timepix detector

Review of Scientific Instruments

Volumn 84, Issue 1, 2013, Pages

  Kiss, Andras ^a   Jungmann, Julia H ^a   Smith, Donald F ^a   Heeren, Ron M A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL DETECTORS; ARRIVAL TIME; COMPLEX SURFACE; DETECTOR SYSTEMS; HIGH SENSITIVITY; HIGHLY PARALLELS; IMAGING CAPABILITIES; IN-VACUUM; PARALLEL ACQUISITION; SECONDARY ION MASS SPECTROMETERS; SIMS IMAGING; TIME-RESOLVED IMAGE; TIMEPIX DETECTORS; TISSUE SECTIONS;

MICROSCOPES; SECONDARY ION MASS SPECTROMETRY; TISSUE;

DETECTORS;

EID: 84874037210     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4772396     Document Type: Article

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