Fast, High Resolution Mass Spectrometry Imaging Using a Medipix Pixelated Detector

Journal of the American Society for Mass Spectrometry

Volumn 21, Issue 12, 2010, Pages 2023-2030

  Jungmann, Julia H ^a   MacAleese, Luke ^a   Buijs, Ronald ^a   Giskes, Frans ^a   de Snaijer, Ad ^a,c   Visser, Jan ^c   Visschers, Jan ^c   Vrakking, Marc J J ^a,b   Heeren, Ron M A ^a,c  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b MAX BORN INSTITUT   (Germany)

^c NIKHEF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; HIGH RESOLUTION MASS SPECTROMETRY; LASER DESORPTION IONIZATION; MEDIPIX; MICRO CHANNEL PLATE; PERFORMANCE CRITERION; PIXEL DETECTOR; PIXELATED DETECTORS; POSITION-SENSITIVE DETECTORS; RESOLVING POWER; SAMPLE SURFACE; SPATIAL DISTRIBUTION; SPATIAL RESOLUTION; TIME OF FLIGHT;

DATA HANDLING; DESORPTION; DETECTORS; IMAGE RESOLUTION; ION MICROSCOPES; PLATE METAL; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

IONS;

METAL OXIDE;

ARTICLE; CONTROLLED STUDY; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; MASS SPECTROMETRY; MICROSCOPE; SEMICONDUCTOR; TRANSMISSION ELECTRON MICROSCOPY;

EID: 78649529365     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jasms.2010.08.014     Document Type: Article

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