Mass spectrometry on the nanoscale with ion sputtering based techniques: What is feasible

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 508-511

  Veryovkin, Igor V ^a   Calaway, Wallis F ^a   Tripa, C Emil ^a   Pellin, Michael J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Laser post ionization; Mass spectrometry; SIMS; SNMS; Useful yield

Indexed keywords

ION SPUTTERING; LASER POST-IONIZATION; MATERIALS CHARACTERIZATION; NANOMETER-SCALE;

IONIZATION; IONS; NANOMECHANICS; SPUTTERING;

MASS SPECTROMETRY;

EID: 34447272489     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.058     Document Type: Article

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