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Volumn 103, Issue 17, 2013, Pages

Microwave characterization of Ti/Au-graphene contacts

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MODEL; CHEMICAL VAPOR DEPOSITION GRAPHENE; CONTACT REGIONS; CONTACT RESISTIVITIES; CORBINO GEOMETRY; MICROWAVE CHARACTERIZATION; MICROWAVE TRANSMISSION; PARALLEL PLATES;

EID: 84887099005     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4826645     Document Type: Article
Times cited : (5)

References (25)
  • 2
    • 84879882443 scopus 로고    scopus 로고
    • 10.1109/JPROC.2013.2257633
    • F. Schwierz, Proc. IEEE 101, 1567 (2013) 10.1109/JPROC.2013.2257633
    • (2013) Proc. IEEE , vol.101 , pp. 1567
    • Schwierz, F.1
  • 13
    • 0001672081 scopus 로고
    • 10.1016/0038-1101(72)90048-2
    • H. H. Berger, Solid-State Electron. 15, 145 (1972). 10.1016/0038-1101(72) 90048-2
    • (1972) Solid-State Electron. , vol.15 , pp. 145
    • Berger, H.H.1
  • 18
    • 84887035579 scopus 로고    scopus 로고
    • in Proceedings of the IEEE 2004 International Conference on Microelectronic Test Structures.
    • J. H. Klootwijk and C. E. Timmering, in Proceedings of the IEEE 2004 International Conference on Microelectronic Test Structures, 2004.
    • (2004)
    • Klootwijk, J.H.1    Timmering, C.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.