Nanogap based graphene coated AFM tips with high spatial resolution, conductivity and durability

Nanoscale

Volumn 5, Issue 22, 2013, Pages 10816-10823

  Lanza, Mario ^a   Gao, Teng ^b   Yin, Zixuan ^a   Zhang, Yanfeng ^b   Liu, Zhongfan ^b   Tong, Yuzhen ^a   Shen, Ziyong ^a   Duan, Huiling ^a  

^a PEKING UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL MEASUREMENT; ENHANCED RESOLUTIONS; HIGH CONDUCTIVITY; HIGH SPATIAL RESOLUTION; INTRINSIC PROPERTY; MICRO ELECTRO MECHANICAL SYSTEM; TIP-SAMPLE CONTACT; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; ELECTROMECHANICAL DEVICES; NANOPROBES;

GRAPHENE;

COPPER; GRAPHITE; POLY(METHYL METHACRYLATE);

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRIC CONDUCTIVITY;

COPPER; ELECTRIC CONDUCTIVITY; GRAPHITE; MICROSCOPY, ATOMIC FORCE; POLYMETHYL METHACRYLATE;

EID: 84886710041     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr03720g     Document Type: Article

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