Multilayer graphene-coated atomic force microscopy tips for molecular junctions

Advanced Materials

Volumn 24, Issue 26, 2012, Pages 3482-3485

  Wen, Yugeng ^a   Chen, Jianyi ^a   Guo, Yunlong ^a   Wu, Bin ^a   Yu, Gui ^a   Liu, Yunqi ^a  

^a INSTITUTE OF CHEMISTRY   (China)

Author keywords

atomic force microscopy; graphene coatings; molecular junctions; multilayer graphene tips

Indexed keywords

ATOMIC FORCE MICROSCOPY TIPS; CONDUCTING PROBE ATOMIC FORCE MICROSCOPIES; HIGH YIELD; MASS PRODUCTION; MOLECULAR ELECTRONIC APPLICATIONS; MOLECULAR JUNCTION; OPERATIONAL STABILITY; SHELF LIFE;

ATOMIC FORCE MICROSCOPY; MULTILAYERS;

GRAPHENE;

GRAPHITE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CHEMISTRY; CONFORMATION; ELECTRICAL EQUIPMENT; ELECTRODE; ELECTRON;

ELECTRICAL EQUIPMENT AND SUPPLIES; ELECTRODES; ELECTRONS; GRAPHITE; MICROSCOPY, ATOMIC FORCE; MODELS, MOLECULAR; MOLECULAR CONFORMATION;

EID: 84863648378     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201200579     Document Type: Article

References (18)

1. R. L. McCreery, A. J. Bergren, Adv. Mater. 2009, 21, 4303.
2. H. B. Akkerman, P. W. M. Blom, D. M. de Leeuw, B. de Boer, Nature 2006, 441, 69.
3. H.-G. Boyen, P. Ziemann, U. Wiedwald, V. Ivanova, D. M. Kolb, S. Sakong, A. Gross, A. Romanyuk, M. Büttner, P. Oelhafen, Nat. Mater. 2006, 5, 394.
4. J. M. Seminario, C. E. De La Cruz, P. A. Derosa, J. Am. Chem. Soc. 2001, 123, 5616.
5. J. M. Beebe, V. B. Engelkes, L. L. Miller, C. D. Frisbie, J. Am. Chem. Soc. 2002, 124, 11268.
6. X. D. Cui, A. Primak, X. Zarate, J. Tomfohr, O. F. Sankey, A. L. Moore, T. A. Moore, D. Gust, G. Harris, S. M. Lindsay, Science 2001, 294, 571.
7. L. Vitali, G. Levita, R. Ohmann, R. Comisso, A. de Vita, K. Kern, Nat. Mater. 2010, 9, 320.
8. D. P. Long, J. L. Lazorcik, B. A. Mantooth, M. H. Moore, M. A. Ratner, A. Troisi, Y. X. Yao, J. W. Ciszek, J. M. Tour, R. Shashidhar, Nat. Mater. 2006, 5, 901.
9. Y. Selzer, A. Salomon, D. Cahen, J. Phys. Chem. B 2002, 106, 10432.
10. Y. Selzer, A. Salomon, D. Cahen, J. Am. Chem. Soc. 2002, 124, 2886.
11. T. Lee, W. Y. Wang, J. F. Klemic, J. J. Zhang, J. Su, M. A. Reed, J. Phys. Chem. B 2004, 108, 8742.
12. V. B. Engelkes, J. M. Beebe, C. D. Frisbie, J. Am. Chem. Soc. 2004, 126, 14287.
13. V. B. Engelkes, J. M. Beebe, C. D. Frisbie, J. Phys. Chem. B 2005, 109, 16801.
14. D. J. Wold, C. D. Frisbie, J. Am. Chem. Soc. 2001, 123, 5549.
15. R. H. M. Smit, Y. Noat, C. Untiedt, N. D. Lang, M. C. van Hemert, J. M. van Ruitenbeek, Nature 2002, 419, 906.
16. A. S. Blum, J. G. Kushmerick, D. P. Long, C. H. Patterson, J. C. Yang, J. C. Henderson, Y. X. Yao, J. M. Tour, R. Shashidhar, B. R. Ratna, Nat. Mater. 2005, 4, 167.
17. W. Y. Wang, T. Lee, M. A. Reed, Phys. Rev. B 2003, 68, 035416.
18. C.-a. Di, D. C. Wei, G. Yu, Y. Q. Liu, Y. L. Guo, D. B. Zhu, Adv. Mater. 2008, 20, 3289.