Influence of Mg doping on the morphology and optical properties of ZnO films for enhanced H2 sensing

Microscopy Research and Technique

Volumn 76, Issue 11, 2013, Pages 1118-1124

  Vijayalakshmi, K ^a   Karthick, K ^a  

^a BISHOP HEBER COLLEGE   (India)

Author keywords

Atomic force microscopy; Hydrogen sensor; Sputtering; Thin films; X ray diffraction

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; ENERGY GAP; HYDROGEN; II-VI SEMICONDUCTORS; IMAGE ENHANCEMENT; LIGHT ABSORPTION; METALLIC FILMS; OPTICAL FILMS; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING; SURFACE ROUGHNESS; THIN FILMS; TOPOGRAPHY; ZINC OXIDE;

ATOMIC-FORCE-MICROSCOPY; DOPED ZNO THIN FILMS; HYDROGEN SENSOR; MG-DOPED ZNO; MG-DOPING; SENSOR RESPONSE; SPUTTERING; THIN-FILMS; X- RAY DIFFRACTIONS; ZNO FILMS;

X RAY DIFFRACTION;

EID: 84885897059     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.22274     Document Type: Article

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