Influence of atomic force microscopy acquisition parameters on thin film roughness analysis

Microscopy Research and Technique

Volumn 75, Issue 7, 2012, Pages 921-927

  Hristu, Radu ^a   Stanciu, Stefan G ^a   Stanciu, George A ^a   Çapan, Inci ^b   Güner, Burcu ^b   Erdoǧan, Matem ^b  

^a UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

^b BALIKESIR UNIVERSITY   (Turkey)

Author keywords

Gas sensing properties; Porphyrin thin films; Scanning probe microscopy; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL DETECTION; GAS DETECTORS; PORPHYRINS; THIN FILMS;

ACQUISITION PARAMETERS; ATOMIC-FORCE-MICROSCOPY; FABRICATION PROCEDURE; FILM ROUGHNESS; GAS SENSING PROPERTIES; MEASURING PARAMETERS; PORPHYRIN THIN FILM; ROUGHNESS ANALYSIS; SCANNING-PROBE MICROSCOPY; THIN-FILMS;

SURFACE ROUGHNESS;

EID: 84862640469     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.22014     Document Type: Article

References (15)

1. Arnold DP, Genga A, Manno D, Micocci G, Serra A, Tepore A, Valli L. 2002. LB multilayers of highly conjugated porphyrin dimers: Differentiation of properties and behaviour between the free base and the metallated derivatives. Colloid Surface A 198-200: 897-904.
2. Bhushan B. 2005. Nanotribology and nanomechanics. Wear 259: 1507-1531.
3. Brittle SA, Richardson TH, Hutchinson J, Hunter CA. 2008. Comparing zinc and manganese porphyrin LB films as amine vapour sensing materials. Colloid Surface A 321: 29-33.
4. Çapan I, Tarimci C, Çapan R. 2010. Fabrication of Langmuir-Blodgett thin films of porphyrins and investigation on their gas sensing properties Sens Actuator B-Chem 144: 126-130.
5. Çayci D, Stanciu SG, Çapan I, Erdoǧan M, Güner B, Hristu R, Stanciu GA. 2011. The influence of the surface morphologies of Langmuir Blodgett (LB) thin films of porphyrins on their gas sensing properties. Sens Actuator B-Chem 158: 62-68.
6. Macagnano A, Zampetti E, Pistillo BR, Pantalei S, Sgreccia E, Paolesse R, d'Agostino R. 2008. Double layer sensors mimic olfactive perception: a case study. Thin Solid Films 516: 7857-7865.
7. Miller JD, Veeramasuneni S, Drelich J, Yalamanchili MR, Yamauchi G. 1996. Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films. Polym Eng Sci 36: 1849-1855.
8. Möller C, Allen M, V.Elings V, Engel A, Müller DJ. 1999. Tapping-mode atomic force microscopy produces faithful high-resolution images of protein surfaces. Biophys J 77: 1150-1158.
9. Pavinatto FJ, Gameiro Jr.AF, Hidalgo AA, Dinelli LR, Romualdo LL, Batista AA, Barbosa Neto NM, Ferreira M, Oliveira Jr.ON. 2008. Langmuir and Langmuir-Blodgett (LB) films of tetrapyridyl metalloporphyrins. Appl Surf Sci 254: 5946-5952.
10. Richardson TH, Dooling CM, Worsfold O, Jones LT, Kato K, Shinbo K, Kaneko F, Tregonning R, Vysotsky MO, Hunter CA. 2002. Gas sensing properties of porphyrin assemblies prepared using ultra-fast LB deposition. Colloid Surface A 198-200: 843-857.
11. Richardson TH, Dooling CM, Jones LT, Brook RA. 2005. Development and optimization of porphyrin gas sensing LB films. Adv Colloid Interface Sci 116: 81-96.
12. Roales J, Pedrosa JM, Castillero P, Cano M, Richardson TH. 2011 Optimization of mixed Langmuir-Blodgett films of a water insoluble porphyrin in a calixarene matrix for optical gas sensing. Thin Solid Films 519: 2025-2030.
13. Salleh MM, Akrajas, Yahaya M. 2002. Optical sensing of capsicum aroma using four porphyrins derivatives thin films. Thin Solid Films 417: 162-165.
14. Teichert C, MacKey JF, Savage DE, Lagally MG, Brohl M, Wagner P. 1995. Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft-x-ray scattering, and atomic-force microsopy. Appl Phys Lett 66: 2346-2348.
15. Walther F, Heckl WM, Stark RW. 2008. Evaluation of nanoscale roughness measurements on a plasma treated SU-8 polymer surface by atomic force microscopy. Appl Surf Sci 254: 7290-7295.