Differences between nanoscale structural and electrical properties of AZO:N and AZO used in polymer light-emitting diodes

Microscopy Research and Technique

Volumn 73, Issue 3, 2010, Pages 202-205

  Chen, Sy Hann ^a   Yu, Chang Feng ^a  

^a NATIONAL CHIAYI UNIVERSITY   (Taiwan)

Author keywords

Conducting atomic force microscopy; Ndoped aluminum zinc oxide; Polymer light emitting diodes; Pulsed laser deposition; Scanning surface potential microscopy

Indexed keywords

ALUMINUM COATINGS; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; CONDUCTING POLYMERS; CONDUCTIVE FILMS; DOPING (ADDITIVES); II-VI SEMICONDUCTORS; NANOTECHNOLOGY; ORGANIC LIGHT EMITTING DIODES (OLED); POLYMER FILMS; PULSED LASERS; SEMICONDUCTING FILMS; SURFACE POTENTIAL; TRANSPARENT CONDUCTING OXIDES; ZINC OXIDE;

AZO FILMS; CONDUCTING ATOMIC FORCE MICROSCOPY; N-DOPED; NANO SCALE; NDOPED ALUMINUM ZINC OXIDE; POLYMER LIGHT EMITTING DIODE; PULSED-LASER DEPOSITION; SCANNING SURFACE-POTENTIAL MICROSCOPY; STRUCTURAL AND ELECTRICAL PROPERTIES; SUBSTRATES TEMPERATURE;

PULSED LASER DEPOSITION;

EID: 76749145507     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20775     Document Type: Article

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