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Volumn 114, Issue 13, 2013, Pages

Leakage current through the poly-crystalline HfO2: Trap densities at grains and grain boundaries

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC FILMS; ELECTRON TRANSPORT PROPERTIES; GRAIN BOUNDARIES; LEAKAGE CURRENTS;

EID: 84885437890     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4823854     Document Type: Article
Times cited : (87)

References (18)
  • 2
    • 43549126477 scopus 로고    scopus 로고
    • 10.1016/S1369-7021(08)70119-6
    • A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6
    • (2008) Mater. Today , vol.11 , pp. 28
    • Sawa, A.1
  • 14
    • 8444242118 scopus 로고
    • 10.1103/PhysRevB.15.989
    • C. H. Henry and D. V. Lang, Phys. Rev. B 15 (2), 989 (1977). 10.1103/PhysRevB.15.989
    • (1977) Phys. Rev. B , vol.15 , Issue.2 , pp. 989
    • Henry, C.H.1    Lang, D.V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.