Characterizations of Ohmic and Schottky-behaving contacts of a single ZnO nanowire

Nanotechnology

Volumn 24, Issue 41, 2013, Pages

  Bercu, Bogdan ^a   Geng, Wei ^b   Simonetti, Olivier ^a   Kostcheev, Sergei ^b   Sartel, Corinne ^c   Sallet, Vincent ^c   Lérondel, Gilles ^b   Molinari, Michaël ^a   Giraudet, Louis ^a   Couteau, Christophe ^b,d  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^c LABORATOIRE DES SCIENCES DU CLIMAT ET DE L ENVIRONNEMENT   (France)

^d CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT BEHAVIOR; CONTACT GEOMETRY; DEPLETION REGION; ELECTRICAL BEHAVIORS; ELECTRICAL POTENTIAL; FUTURE APPLICATIONS; KELVIN PROBE FORCE MICROSCOPY; NANOSCALE FIELD-EFFECT TRANSISTORS;

CHEMICAL VAPOR DEPOSITION; ELECTRIC CONTACTORS; FIELD EFFECT TRANSISTORS; OHMIC CONTACTS; ORGANIC CHEMICALS; ZINC OXIDE;

NANOWIRES;

NANOWIRE; ZINC OXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRICITY; NANOTECHNOLOGY; SURFACE PROPERTY; ULTRASTRUCTURE;

ELECTRICITY; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; NANOWIRES; SURFACE PROPERTIES; ZINC OXIDE;

EID: 84884618720     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/41/415202     Document Type: Article

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