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Volumn 86, Issue 3, 2005, Pages 1-3

Electrical properties of ZnO nanowire field effect transistors characterized with scanning probes

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; NANOSTRUCTURED MATERIALS; SCANNING; WIRE; ZINC OXIDE;

CONTACT RESISTANCE; CURRENT TRANSPORT; NANOWIRE; SCANNING PROBES;

FIELD EFFECT TRANSISTORS;

EID: 17044424574 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1851621 Document Type: Article

Times cited : (141)

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