Thermoelectric imaging of structural disorder in epitaxial graphene

Nature Materials

Volumn 12, Issue 10, 2013, Pages 913-918

  Cho, Sanghee ^a   Kang, Stephen Dongmin ^a   Kim, Wondong ^a   Lee, Eui Sup ^b   Woo, Sung Jae ^b   Kong, Ki Jeong ^c   Kim, Ilyou ^d   Kim, Hyeong Do ^d,f   Zhang, Tong ^e,g   Stroscio, Joseph A ^e   Kim, Yong Hyun ^b   Lyeo, Ho Ki ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c Korea Research Institute of Chemical Technology   (South Korea)

^d Pohang University of Science and Technology (POSTECH)   (South Korea)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^f Seoul National University   (South Korea)

^g FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; IMAGING TECHNIQUES; POINT DEFECTS; SOLITONS;

DIFFERENTIAL CONTRAST; LOCAL DENSITY OF STATE; MICROSCOPIC MEASUREMENT; TEMPERATURE DIFFERENCES; THERMOELECTRIC MEASUREMENTS; THERMOELECTRIC SIGNALS; THERMOELECTRIC VOLTAGE; THERMOPOWER MEASUREMENTS;

GRAPHENE;

EID: 84884591247     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat3708     Document Type: Article

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