Three-dimensional modeling of nanoscale Seebeck measurements by scanning thermoelectric microscopy

Applied Physics Letters

Volumn 87, Issue 5, 2005, Pages

  Bian, Zhixi ^a   Shakouri, Ali ^a   Shi, Li ^b   Lyeo, Ho Ki ^c   Shih, C K ^c  

^a University of California Santa Cruz   (United States)

^b The University of Texas at Austin   (United States)

^c UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MODELING; NANOSCALE SEEBECK MEASUREMENTS; SCANNING THERMOELECTRIC MICROSCOPY (STHEM); SEEBECK PROFILING;

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHONONS; TEMPERATURE; THERMOELECTRICITY;

SEEBECK EFFECT;

EID: 33645513030     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2008381     Document Type: Article

References (6)

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5. Ho-Ki Lyeo, A. A. Khajetoorians, Li Shi, Kevin P. Pipe, Rajeev J. Ram, Ali Shakouri, and C. K. Shih, Science 303, 816 (2004).
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