Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

Ultramicroscopy

Volumn 136, Issue , 2014, Pages 96-106

  Passeri, D ^a   Dong, C ^a   Angeloni, L ^a   Pantanella, F ^a,b   Natalizi, T ^b   Berlutti, F ^a,b   Marianecci, C ^a   Ciccarello, F ^c   Rossi, M ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

^c UNIVERSITY OF PALERMO   (Italy)

Author keywords

Atomic force microscopy; Bacteria; Magnetic force microscopy; Periodic magnetic domains; Thickness measurement

Indexed keywords

ATOMIC FORCE MICROSCOPY; BACTERIA; MAGNETIC DOMAINS; MAGNETIC FORCE MICROSCOPY; THICKNESS GAGES; THICKNESS MEASUREMENT; THIN FILMS;

ACCURATE MEASUREMENT; DETECTION LIMITS; LIMIT OF DETECTION; MAGNETIC SUBSTRATE; PHASE DIFFERENCE; QUANTITATIVE MEASUREMENT; STAPHYLOCOCCUS AUREUS; THICKNESS OF THE FILM;

SUBSTRATES;

ACCURACY; ARTICLE; BACTERIUM ADHERENCE; CONTROLLED STUDY; LIMIT OF DETECTION; MAGNETIC SUBSTRATE; MATERIALS; MICROSCOPY; NONHUMAN; PARTICLE SIZE; PHASE DIFFERENCE MAGNETIC FORCE MICROSCOPY; PROCEDURES; QUANTITATIVE ANALYSIS; SOFT THIN FILM; STAPHYLOCOCCUS AUREUS; THICKNESS;

STAPHYLOCOCCUS AUREUS;

ATOMIC FORCE MICROSCOPY; BACTERIA; MAGNETIC FORCE MICROSCOPY; PERIODIC MAGNETIC DOMAINS; THICKNESS MEASUREMENT;

MAGNETIC PHENOMENA; MICROSCOPY, ATOMIC FORCE; STAPHYLOCOCCUS AUREUS; SURFACE PROPERTIES;

EID: 84884337443     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.08.001     Document Type: Article

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