In situ thickness measurements of ultra-thin multilayer polymer films by atomic force microscopy

Nanotechnology

Volumn 10, Issue 4, 1999, Pages 389-393

  Lobo, R F M ^a,b   Pereira da Silva, M A ^a   Raposo, M ^a,b   Faria, R M ^a   Oliveira Jr , O N ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b UNIVERSIDADE NOVA DE LISBOA   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; MULTILAYERS; POLYELECTROLYTES; SILICON WAFERS; STIFFNESS; THICKNESS MEASUREMENT; ULTRATHIN FILMS;

FURROW METHOD;

PLASTIC FILMS;

EID: 0033341347     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/10/4/305     Document Type: Article

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