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Volumn 1, Issue 2, 2012, Pages

Evaluation of the bulk lifetime of silicon wafers by immersion in hydrofluoric acid and illumination

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Indexed keywords


EID: 84884204789     PISSN: 21628769     EISSN: 21628777     Source Type: Journal    
DOI: 10.1149/2.003202jss     Document Type: Article
Times cited : (37)

References (43)
  • 3
    • 74049149370 scopus 로고    scopus 로고
    • Separation of bulk and surface recombination by steady state photo conductance measurements
    • Glasgow, May
    • th PVSEC, Glasgow, May, 2000.
    • (2000) th PVSEC
    • Bail, M.1    Brendel, R.2
  • 17
    • 84887367112 scopus 로고    scopus 로고
    • Wet-chemical pre-treatment of c-Si substrates enhancing the performance of a-SiC:H/c-Si heterojunction solar cells
    • Hamburg, Sept.
    • J. P. Becker, D. Pysch, A. Leimenstoll, M. Hermle, and S. W. Glunz, Wet-chemical pre-treatment of c-Si substrates enhancing the performance of a-SiC:H/c-Si heterojunction solar cells. 24th EUPVSEC, Hamburg, Sept. 2009.
    • (2009) 24th EUPVSEC
    • Becker, J.P.1    Pysch, D.2    Leimenstoll, A.3    Hermle, M.4    Glunz, S.W.5
  • 32
    • 0022306789 scopus 로고
    • Measurement of the emitter saturation current by a contactless photoconductivity decay method
    • Las Vagas
    • D. E. Kane and R. M. Swanson, Measurement of the emitter saturation current by a contactless photoconductivity decay method. 18th IEEE Photovoltaic Specialists Conference, Las Vagas 1985.
    • (1985) 18th IEEE Photovoltaic Specialists Conference
    • Kane, D.E.1    Swanson, R.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.