Experimental verification of the effect of depletion-region modulation on photoconductance lifetime measurements

Journal of Applied Physics

Volumn 95, Issue 4, 2004, Pages 1854-1858

  Cousins, Peter J ^a   Neuhaus, Dirk H ^a   Cotter, Jeffrey E ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRON TRAPS; INTEGRAL EQUATIONS; OPTIMIZATION; OXIDATION; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR MATERIALS; SUBSTRATES;

BULK REGION; DEPLETION REGION; MODULATION REGION; PHOTOCONDUCTANCE LIFETIME MEASUREMENT;

SEMICONDUCTOR JUNCTIONS;

EID: 1542306857     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1638618     Document Type: Article

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