Low-force AFM nanomechanics with higher-eigenmode contact resonance spectroscopy

Nanotechnology

Volumn 23, Issue 5, 2012, Pages

  Killgore, Jason P ^a,b   Hurley, Donna C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UCB 450   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ANALYTICAL MODEL; BEAM MODEL; BULK MEASUREMENT; CONTACT FORCES; CONTACT RESONANCE; DIRECT MEASUREMENT; DYNAMIC CONTACTS; EIGEN MODES; EXPERIMENTAL CONDITIONS; GLASS SAMPLES; HIGHER MODE; LATERAL STIFFNESS; MECHANICAL CHARACTERIZATIONS; MODEL PARAMETERS; MODULUS MEASUREMENTS; NANOFEATURES; NANONEWTONS; QUANTITATIVE MEASUREMENT; REALISTIC GEOMETRY; TIP-SAMPLE CONTACT;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CHARACTERIZATION; MATHEMATICAL MODELS; NANOCANTILEVERS; ULTRATHIN FILMS;

FINITE ELEMENT METHOD;

EID: 84855765075     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/5/055702     Document Type: Article

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