메뉴 건너뛰기




Volumn 60, Issue 9, 2013, Pages 2854-2861

Modeling and design guidelines for P+ guard rings in lightly doped CMOS substrates

Author keywords

Compact model; guard ring; mixed signal IC; P + contact; P well; substrate noise

Indexed keywords

COMPACT MODEL; GUARD-RINGS; MIXED-SIGNAL IC; P-WELL; SUBSTRATE NOISE;

EID: 84883310382     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2275177     Document Type: Article
Times cited : (15)

References (18)
  • 1
    • 59849124094 scopus 로고    scopus 로고
    • Statistical timing models for large macro cells and ip blocks considering process variations
    • Feb
    • A. Goel, S. Vrudhula, F. Taraporevala, and P. Ghanta, "Statistical timing models for large macro cells and IP blocks considering process variations," IEEE Trans. Semicond. Manuf., vol. 22, no. 1, pp. 3-11, Feb. 2009.
    • (2009) IEEE Trans. Semicond. Manuf , vol.22 , Issue.1 , pp. 3-11
    • Goel, A.1    Vrudhula, S.2    Taraporevala, F.3    Ghanta, P.4
  • 2
    • 2442530854 scopus 로고    scopus 로고
    • Substrate noise-coupling characterization and efficient suppression in cmos technology
    • May
    • W.-K. Yeh, S.-M. Chen, and Y.-K. Fang, "Substrate noise-coupling characterization and efficient suppression in CMOS technology," IEEE Trans. Electron Devices, vol. 51, no. 5, pp. 817-819, May 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , Issue.5 , pp. 817-819
    • Yeh, W.-K.1    Chen, S.-M.2    Fang, Y.-K.3
  • 3
    • 26444580188 scopus 로고    scopus 로고
    • Psub Guard ring design and modeling for the purpose of substrate noise isolation in the SOC era
    • DOI 10.1109/LED.2005.854351
    • T.-L. Hsu, Y.-C. Chen, H.-C. Tseng, V. Liang, and J. Jan, "Psub guard ring design and modeling for the purpose of substrate noise isolation in the SOC era," IEEE Electron Device Lett., vol. 26, no. 9, pp. 693-695, Sep. 2005. (Pubitemid 41430970)
    • (2005) IEEE Electron Device Letters , vol.26 , Issue.9 , pp. 693-695
    • Hsu, T.-L.1    Chen, Y.-C.2    Tseng, H.-C.3    Liang, V.4    Jan, J.S.5
  • 4
    • 33746900456 scopus 로고    scopus 로고
    • Synthesized compact models and experimental verifications for substrate noise coupling in mixed-signal ics
    • Aug
    • H. Lan, T. Chen, C. Chui, P. Nikaeen, J. Kim, and R. Dutton, "Synthesized compact models and experimental verifications for substrate noise coupling in mixed-signal ICs," IEEE J. Solid-State Circuits, vol. 41, no. 8, pp. 1817-1829, Aug. 2006.
    • (2006) IEEE J. Solid-State Circuits , vol.41 , Issue.8 , pp. 1817-1829
    • Lan, H.1    Chen, T.2    Chui, C.3    Nikaeen, P.4    Kim, J.5    Dutton, R.6
  • 5
    • 25144459880 scopus 로고    scopus 로고
    • A surface potential model for predicting substrate noise coupling in integrated circuits
    • DOI 10.1109/JSSC.2005.848172
    • S. Kristiansson, F. Ingvarson, S. Kagganti, N. Simic, M. Zgrda, and K. Jeppson, "A surface potential model for predicting substrate noise coupling in integrated circuits," IEEE J. Solid-State Circuits, vol. 40, no. 9, pp. 1797-1803, Sep. 2005. (Pubitemid 41352156)
    • (2005) IEEE Journal of Solid-State Circuits , vol.40 , Issue.9 , pp. 1797-1803
    • Kristiansson, S.1    Ingvarson, F.2    Kagganti, S.P.3    Simic, N.4    Zgrda, M.5    Jeppson, K.O.6
  • 7
    • 41749107752 scopus 로고    scopus 로고
    • Compact spreading resistance model for rectangular contacts on uniform and epitaxial substrates
    • DOI 10.1109/TED.2007.902689
    • S. Kristiansson, F. Ingvarson, and K. Jeppson, "Compact spreading resistance model for rectangular contacts on uniform and epitaxial substrates," IEEE Trans. Electron Devices, vol. 54, no. 9, pp. 2531-2536, Sep. 2007. (Pubitemid 351485771)
    • (2007) IEEE Transactions on Electron Devices , vol.54 , Issue.9 , pp. 2531-2536
    • Kristiansson, S.1    Ingvarson, F.2    Jeppson, K.O.3
  • 9
    • 0003852007 scopus 로고
    • 2nd ed. Upper Saddle River, NJ, USA: Prentice-Hall
    • D. Cheng, Field and Wave Electromagnetics, 2nd ed. Upper Saddle River, NJ, USA: Prentice-Hall, 1989.
    • (1989) Field and Wave Electromagnetics
    • Cheng, D.1
  • 11
    • 0033311127 scopus 로고    scopus 로고
    • Electrical contact resistance: Properties of stationary interfaces
    • DOI 10.1109/6144.759357
    • R. Timsit, "Electrical contact resistance: Properties of stationary interfaces," IEEE Trans. Compon. Packag. Technol., vol. 22, no. 1, pp. 85-98, Mar. 1999. (Pubitemid 30559398)
    • (1999) IEEE Transactions on Components and Packaging Technologies , vol.22 , Issue.1 , pp. 85-98
    • Timsit, R.S.1
  • 12
    • 49949122961 scopus 로고
    • Resistance calculations for thin film patterns
    • P. M. Hall, "Resistance calculations for thin film patterns," Thin Solid Films, vol. 1, no. 4, pp. 277-295, 1968.
    • (1968) Thin Solid Films , vol.1 , Issue.4 , pp. 277-295
    • Hall, P.M.1
  • 13
    • 0031146518 scopus 로고    scopus 로고
    • Resistance calculations for thin film rectangles
    • PII S0040609096094953
    • P. M. Hall, "Resistance calculations for thin film rectangles," Thin Solid Films, vol. 300, nos. 1-2, pp. 256-264, 1997. (Pubitemid 127393851)
    • (1997) Thin Solid Films , vol.300 , Issue.1-2 , pp. 256-264
    • Hall, P.M.1
  • 14
    • 84875965920 scopus 로고    scopus 로고
    • A compact p+ contact resistance model for characterization of substrate coupling in modern lightly doped cmos processes
    • Oct
    • M. Shen, J. Mikkelsen, O. Jensen, and T. Larsen, "A compact P+ contact resistance model for characterization of substrate coupling in modern lightly doped CMOS processes," in Proc. 7th Eur. Microw. Integr. Circuits Conf., Oct. 2012, pp. 492-495.
    • (2012) Proc. 7th Eur. Microw. Integr. Circuits Conf , pp. 492-495
    • Shen, M.1    Mikkelsen, J.2    Jensen, O.3    Larsen, T.4
  • 15
    • 0001691745 scopus 로고
    • The self and mutual inductance of linear conductors
    • Jan
    • E. Rosa, "The self and mutual inductance of linear conductors," Bull. Bureau Stand., vol. 4, pp. 301-344, Jan. 1908.
    • (1908) Bull. Bureau Stand , vol.4 , pp. 301-344
    • Rosa, E.1
  • 16
    • 58049188077 scopus 로고    scopus 로고
    • A measurement fixture suitable for measuring substrate noise in the uwb frequency band
    • Jan
    • M. Shen, T. Tong, J. Mikkelsen, and T. Larsen, "A measurement fixture suitable for measuring substrate noise in the UWB frequency band," Analog Integr. Circuits Signal Process., vol. 58, no. 1, pp. 11-17, Jan. 2009.
    • (2009) Analog Integr. Circuits Signal Process , vol.58 , Issue.1 , pp. 11-17
    • Shen, M.1    Tong, T.2    Mikkelsen, J.3    Larsen, T.4
  • 17
    • 33947389668 scopus 로고    scopus 로고
    • Substrate noise coupling in soc design: Modeling, avoidance, and validation
    • Dec
    • A. Afzali-Kusha, M. Nagata, N. Verghese, and D. Allstot, "Substrate noise coupling in SoC design: Modeling, avoidance, and validation," Proc. IEEE, vol. 94, no. 12, pp. 2109-2138, Dec. 2006.
    • (2006) Proc. IEEE , vol.94 , Issue.12 , pp. 2109-2138
    • Afzali-Kusha, A.1    Nagata, M.2    Verghese, N.3    Allstot, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.