A compact P+ contact resistance model for characterization of substrate coupling in modern lightly doped CMOS processes

European Microwave Week 2012: "Space for Microwaves", EuMW 2012, Conference Proceedings - 7th European Microwave Integrated Circuits Conference, EuMIC 2012

Volumn , Issue , 2012, Pages 492-495

  Shen, Ming ^a   Mikkelsen, Jan H ^a   Jensen, Ole K ^a   Larsen, Torben ^a  

^a AALBORG UNIVERSITY   (Denmark)

Author keywords

Conformal mapping; Contact resistance; Integrated circuit noise; Substrates; System on a chip

Indexed keywords

CLOSED-FORM EXPRESSION; COMPACT RESISTANCE; EPITAXIAL SUBSTRATES; INTEGRATED CIRCUIT NOISE; MIXED-SIGNAL SYSTEMS; SUBSTRATE COUPLINGS; SUBSTRATE NOISE COUPLING; SYSTEM-ON-A-CHIP;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; CONFORMAL MAPPING; CONTACT RESISTANCE; ELECTRIC SIGNAL SYSTEMS; MICROPROCESSOR CHIPS; MICROWAVE INTEGRATED CIRCUITS; SCATTERING PARAMETERS; SUBSTRATES;

COMPUTER SIMULATION;

EID: 84875965920     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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