Contact resistance of thin metal film contacts

IEEE Transactions on Components and Packaging Technologies

Volumn 29, Issue 2, 2006, Pages 371-378

  Norberg, Gunnar ^a,b,c   Dejanovic, Slavko ^b,c   Hesselbom, Hjalmar ^b  

^a Solectron Sweden AB   (Sweden)

^b MID SWEDEN UNIVERSITY   (Sweden)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Constriction resistance; Contact resistance; Holm resistance; Maxwell resistance; Metal film; Microconnector; Microelectromechanical system (MEMS) relay; Microrelay; Sharvin resistance

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC RESISTANCE; ERROR ANALYSIS; ESTIMATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROELECTROMECHANICAL DEVICES; NUMERICAL METHODS;

CONSTRICTION RESISTANCE; CONTACT RESISTANCE; HOLM RESISTANCE; MAXWELL RESISTANCE; METAL FILM; MICROCONNECTOR; MICRORELAY; SHARVIN RESISTANCE;

THIN FILMS;

EID: 33744831222     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2006.875891     Document Type: Article

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