-
1
-
-
0035274550
-
Measuring and modeling the effects of substrate noise on the LNA for a CMOS GPS receiver
-
Mar.
-
M. Xu, D. K. Su, D. K. Shaeffer, T. H. Lee, and B. A. Wooley, "Measuring and modeling the effects of substrate noise on the LNA for a CMOS GPS receiver," IEEE J. Solid-State Circuits, vol. 36, no. 3, pp. 473-485, Mar. 2001.
-
(2001)
IEEE J. Solid-state Circuits
, vol.36
, Issue.3
, pp. 473-485
-
-
Xu, M.1
Su, D.K.2
Shaeffer, D.K.3
Lee, T.H.4
Wooley, B.A.5
-
2
-
-
0027576336
-
Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits
-
Apr.
-
D. K. Su, M. J. Loinaz, S. Masui, and B. A. Wooley, "Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits," IEEE J. Solid-State Circuits, vol. 28, no. 4, pp. 420-430, Apr. 1993.
-
(1993)
IEEE J. Solid-state Circuits
, vol.28
, Issue.4
, pp. 420-430
-
-
Su, D.K.1
Loinaz, M.J.2
Masui, S.3
Wooley, B.A.4
-
3
-
-
77955176211
-
-
[Online]
-
SubstrateStorm. Cadence Design System. [Online]. Available: http://www.cadence.com/datasheets/substratestorm.html
-
Cadence Design System
-
-
-
4
-
-
0038642504
-
Substrate resistance modeling for noise coupling analysis
-
Mar.
-
S. Kristiansson, S. P. Kagganti, T. Ewert, F. Ingvarson, J. Olsson, and K. O. Jeppson, "Substrate resistance modeling for noise coupling analysis," in Proc. IEEE Int. Conf. Microelectronic Test Structures, Mar. 2003, pp. 124-129.
-
(2003)
Proc. IEEE Int. Conf. Microelectronic Test Structures
, pp. 124-129
-
-
Kristiansson, S.1
Kagganti, S.P.2
Ewert, T.3
Ingvarson, F.4
Olsson, J.5
Jeppson, K.O.6
-
5
-
-
17044378150
-
A surface potential model for predicting substrate noise coupling in integrated circuits
-
Oct.
-
S. Kristiansson, F. Ingvarson, S. P. Kagganti, and K. O. Jeppson, "A surface potential model for predicting substrate noise coupling in integrated circuits," in Proc. IEEE Custom Integrated Circuits Conf., Oct. 2004, pp. 497-500.
-
(2004)
Proc. IEEE Custom Integrated Circuits Conf.
, pp. 497-500
-
-
Kristiansson, S.1
Ingvarson, F.2
Kagganti, S.P.3
Jeppson, K.O.4
-
7
-
-
0014445811
-
Application of multilayer potential distribution to spreading resistance correction factors
-
P. Schumann Jr. and E. Gardner, "Application of multilayer potential distribution to spreading resistance correction factors," J. Electrochem. Soc., vol. 116, no. 1, pp. 87-91, 1969.
-
(1969)
J. Electrochem. Soc.
, vol.116
, Issue.1
, pp. 87-91
-
-
Schumann Jr., P.1
Gardner, E.2
-
8
-
-
0016971713
-
On the calculation of spreading resistance correction factors
-
S. C. Choo, M. S. Leong, and K. L. Kuan, "On the calculation of spreading resistance correction factors." Solid-State Electron., vol. 19, pp. 561-565, 1976.
-
(1976)
Solid-state Electron.
, vol.19
, pp. 561-565
-
-
Choo, S.C.1
Leong, M.S.2
Kuan, K.L.3
-
9
-
-
0000849007
-
Calculation of the electrical capacitance of a cube
-
Feb.
-
D. K. Reitan and T. J. Higgins, "Calculation of the electrical capacitance of a cube," J. Appl. Phys., vol. 22, no. 2, pp. 223-226, Feb. 1951.
-
(1951)
J. Appl. Phys.
, vol.22
, Issue.2
, pp. 223-226
-
-
Reitan, D.K.1
Higgins, T.J.2
-
10
-
-
3042711620
-
Accurate determination of the capacitance of a thin rectangular plate
-
Jan.
-
_, "Accurate determination of the capacitance of a thin rectangular plate," Trans. Amer. Inst. Electr. Eng. - Commun. Electron., vol. 75, no. 28. pp. 761-766, Jan. 1957.
-
(1957)
Trans. Amer. Inst. Electr. Eng. - Commun. Electron.
, vol.75
, Issue.28
, pp. 761-766
-
-
-
11
-
-
0030270723
-
Modeling substrate effects in the design of high-speed Si-Bipolar IC's
-
Oct.
-
M. Pfost, H.-M. Rein, and T. Holzwarth, "Modeling substrate effects in the design of high-speed Si-Bipolar IC's," IEEE J. Solid-State Circuits, vol. 31, no. 10. pp. 1493-1501, Oct. 1996.
-
(1996)
IEEE J. Solid-state Circuits
, vol.31
, Issue.10
, pp. 1493-1501
-
-
Pfost, M.1
Rein, H.-M.2
Holzwarth, T.3
-
12
-
-
25144465219
-
-
Comsol. [Online]
-
Femlab 3.0. Comsol. [Online]. Available: http://www.comsol.com/
-
Femlab 3.0
-
-
-
13
-
-
0036053286
-
A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes
-
D. Ozis, T. Fiez, and K. Mayaram, "A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes," in Proc. IEEE Custom Integrated Circuits Conf., 2002, pp. 497-500.
-
(2002)
Proc. IEEE Custom Integrated Circuits Conf.
, pp. 497-500
-
-
Ozis, D.1
Fiez, T.2
Mayaram, K.3
-
14
-
-
0030110603
-
Verification techniques for substrate coupling and their application to mixed-signal IC design
-
Mar.
-
N. K. Verghese, D. J. Allstot, and M. A. Wolfe, "Verification techniques for substrate coupling and their application to mixed-signal IC design," IEEE J. Solid-State Circuits, vol. 31. no. 3, pp. 354-365, Mar. 1996.
-
(1996)
IEEE J. Solid-state Circuits
, vol.31
, Issue.3
, pp. 354-365
-
-
Verghese, N.K.1
Allstot, D.J.2
Wolfe, M.A.3
-
15
-
-
25144434530
-
Resistance modeling in ID, 2D. and 3-D for substrate networks
-
S. P. Kagganti, S. Kristiansson, F. Ingvarson, and K. O. Jeppson, "Resistance modeling in ID, 2D. and 3-D for substrate networks," Physica Scripta, vol. T114, pp. 217-222, 2004.
-
(2004)
Physica Scripta
, vol.T114
, pp. 217-222
-
-
Kagganti, S.P.1
Kristiansson, S.2
Ingvarson, F.3
Jeppson, K.O.4
-
16
-
-
25144479474
-
Compact modeling and experimental verification of substrate resistance in lightly doped substrates
-
Oct.
-
H. Lan, T. W. Chen, C. O. Chui, and R. W. Dutton, "Compact modeling and experimental verification of substrate resistance in lightly doped substrates," in Proc. 12th Workshop on Synthesis and System Integration of Mixed Information Technologies, Oct. 2004, pp. 189-195.
-
(2004)
Proc. 12th Workshop on Synthesis and System Integration of Mixed Information Technologies
, pp. 189-195
-
-
Lan, H.1
Chen, T.W.2
Chui, C.O.3
Dutton, R.W.4
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