Compact spreading resistance model for rectangular contacts on uniform and epitaxial substrates

IEEE Transactions on Electron Devices

Volumn 54, Issue 9, 2007, Pages 2531-2536

  Kristiansson, Simon ^a   Ingvarson, Fredrick ^a   Jeppson, Kjell O ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

Elliptic integral; Rectangular contact; Spreading resistance modeling; Substrate noise coupling

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONTACTS; EPITAXIAL LAYERS; FINITE ELEMENT METHOD; SPURIOUS SIGNAL NOISE;

RECTANGULAR CONTACT; SPREADING RESISTANCE MODELING; SUBSTRATE NOISE COUPLING;

SUBSTRATES;

EID: 41749107752     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.902689     Document Type: Article

References (18)

1. T. Kadoyama, N. Suzuki, N. Sasho, H. Iizuka, I. Nagase, H. Usukubo, and M. Katakura, "A complete single-chip GPS receiver with 1.6-V 24-mW radio in 0.18-μm CMOS," IEEE J. Solid-State Circuits, vol. 39, no. 4, pp. 562-568, Apr. 2004.
2. M. Jeske, G. Blakiewicz, M. Chrzanowska-Jeske, and B. Wang, "Substrate noise-aware floorplanning for mixed-signal SoCs," in Proc. IEEE Int. Symp. Circuits and Syst., 2004, pp. 445-448.
3. A. J. van Genderen, N. P. van der Meijs, and T. Smedes, "Fast computation of substrate resistances in large circuits," in Proc. Eur. Des. and Test Conf., 1996, pp. 560-565.
4. D. K. Su, M. J. Loinaz, S. Masui, and B. A. Wooley, "Experimental results and modeling techniques for substrate noise in mixed-signal integrated circuits," IEEE J. Solid-State Circuits, vol. 28, no. 4, pp. 420-430, Apr. 1993.
5. I. N. Sneddon, Mixed Boundary Value Problems in Potential Theory. Hoboken, NJ: Wiley, 1966.
6. P. Schumann, Jr. and E. Gardner, "Application of multilayer potential distribution to spreading resistance correction factors," J. Electrochem. Soc., vol. 116, no. 1, pp. 87-91, Jan. 1969.
7. L. Deferm, C. Claeys, and G. J. Declerck, "Two- and three-dimensional calculation of substrate resistance," IEEE Trans. Electron Devices vol. 35, no. 3, pp. 339-352, Mar. 1988.
8. D. Ozis, T. Fiez, and K. Mayaram, "A comprehensive geometry-dependent macromodel for substrate noise coupling in heavily doped CMOS processes," in Proc. IEEE Custom Integr. Circuits Conf., 2002, pp. 497-500.
9. S. Kristiansson, F. Ingvarson, and K. O. Jeppson, "Modeling of rectangular contacts for noise coupling analysis in homogeneous substrates," in Proc. IEEE Norchip Conf., Nov. 2005, pp. 24-27.
10. O. D. Kellogg, Foundations of Potential Theory. New York: Dover, 1953.
11. M. Abramowitz and I. Stegun, Handbook of Mathematical Functions. New York: Dover, 1965.
12. R. H. Cox and H. Strack, "Ohmic contacts for GaAs devices," Solid State Electron., vol. 10, no. 12, pp. 1213-1218, Dec. 1967.
13. R. Holm, Electric Contacts: Theory and Applications, 4th ed. New York: Springer-Verlag, 1967.
14. Comsol, COMSOL Multiphysics. version 3.2. [Online]. Available: http://www.comsol.com/
15. M. S. Leong, S. C. Choo, and L. S. Tan, "The role of source boundary condition in spreading resistance calculations," Solid State Electron., vol. 21, no. 7, pp. 933-941, Jul. 1978.
16. B. Gelmont and M. Shur, "Spreading resistance of a round ohmic contact," Solid State Electron., vol. 36, no. 2, pp. 143-146, Feb. 1993.
17. M. W. Denholf, "An accurate calculation of spreading resistance," J. Phys. D, Appl. Phys., vol. 39, no. 9, pp. 1761-1765, May 2006.
18. H. Lan, T. W. Chen, C. O. Chui, and R. W. Dutton, "Compact modeling and experimental verification of substrate resistance in lightly doped substrates," in Proc. 12th Workshop Synthesis and Syst. Integr. Mixed Inf. Technol., Oct. 2004, pp. 189-195.