Hard x-ray photoelectron spectroscopy and electrical characterization study of the surface potential in metal/Al2O3/GaAs(100) metal-oxide-semiconductor structures

Physical Review B - Condensed Matter and Materials Physics

Volumn 88, Issue 4, 2013, Pages

  Walsh, Lee A ^a   Hughes, Greg ^a   Lin, Jun ^b   Hurley, Paul K ^b   O'Regan, Terrance P ^c   Cockayne, Eric ^d   Woicik, Joseph C ^d  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b UNIVERSITY COLLEGE CORK   (Ireland)

^c U S ARMY RESEARCH LABORATORY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84883147650     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.88.045322     Document Type: Article

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