Grain boundary investigations on sulfurized Cu(In,Ga)(S,Se)2 solar cells using atom probe tomography

Solar Energy Materials and Solar Cells

Volumn 117, Issue , 2013, Pages 592-598

  Keller, J ^a   Schlesiger, R ^b   Riedel, I ^a   Parisi, J ^a   Schmitz, G ^b   Avellan, A ^c   Dalibor, T ^c  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b UNIVERSITY OF MÜNSTER   (Germany)

^c AVANCIS GMBH   (Germany)

Author keywords

APT; CIGS; CIGSSe; CIS; Grain boundary; TAP

Indexed keywords

APT; ATOM PROBE TOMOGRAPHY; CIGS; CIGSSE; CIS; INTERFACE DIFFUSION; PHOTOVOLTAIC THIN FILMS; SODA LIME GLASS SUBSTRATE;

AGGLOMERATION; SEMICONDUCTING SELENIUM COMPOUNDS; SULFUR; TAPS;

GRAIN BOUNDARIES;

EID: 84883115037     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2013.07.034     Document Type: Article

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