|
Volumn 16, Issue 2, 2004, Pages
|
Texture of Cu(In, Ga)Se2 thin films and nanoscale cathodoluminescence
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CATHODOLUMINESCENCE;
COPPER COMPOUNDS;
ELECTROOPTICAL EFFECTS;
EVAPORATION;
FILM GROWTH;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
IMAGE ANALYSIS;
NANOSTRUCTURED MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SPECTROMETERS;
TEXTURES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
BRIGHT-FIELD (BF) MODE;
COEVAPORATION;
THIN FILMS;
|
EID: 0442279497
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/16/2/010 Document Type: Conference Paper |
Times cited : (40)
|
References (5)
|