Atom probe study of Cu-poor to Cu-rich transition during Cu(In,Ga)Se 2 growth

Applied Physics Letters

Volumn 99, Issue 23, 2011, Pages

  Couzinie Devy, F ^a   Cadel, E ^a   Barreau, N ^b   Arzel, L ^b   Pareige, P ^a  

^a UNIVERSITÉ ET INSA DE ROUEN   (France)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM DISTRIBUTION; ATOM PROBE; ATOM PROBE TOMOGRAPHY; ATOMIC DISTRIBUTION; ATOMIC SCALE; CU(IN , GA)SE; CU-POOR; GRAIN-BOUNDARY COMPOSITION; GROWING PROCESS; KEYPOINTS; POLYCRYSTALLINE;

ATOMS; GALLIUM; GRAIN BOUNDARIES; PROBES; SEMICONDUCTING SELENIUM COMPOUNDS; SODIUM;

COPPER;

EID: 83455172667     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665948     Document Type: Article

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