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Volumn 108, Issue 7, 2012, Pages

Direct insight into grain boundary reconstruction in polycrystalline Cu(In,Ga)Se 2 with atomic resolution

(6) Abou Ras, Daniel a Schaffer, Bernhard b,c Schaffer, Miroslava b,d Schmidt, Sebastian S a Caballero, Raquel a,e Unold, Thomas a

a HAHN MEITNER INSTITUT (Germany)

b DARESBURY LABORATORY (United Kingdom)

c UNIVERSITY OF GLASGOW (United Kingdom)

d UNIVERSITY OF LIVERPOOL (United Kingdom)

e UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANTICORRELATION; ANTISITES; ATOMIC PLANES; ATOMIC RESOLUTION; CU(IN , GA)SE; ESSENTIAL ELEMENTS; GRAIN-BOUNDARY RECONSTRUCTION; HIGH RESOLUTION; POLYCRYSTALLINE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TWIN BOUNDARIES;

ATOMS; ELECTRON ENERGY LOSS SPECTROSCOPY; GALLIUM; GRAIN BOUNDARIES; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84857246196 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.075502 Document Type: Article

Times cited : (95)

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