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Volumn 111, Issue 6, 2012, Pages

Complementary metal-oxide-semiconductor-compatible and self-aligned catalyst formation for carbon nanotube synthesis and interconnect fabrication

Author keywords

[No Author keywords available]

Indexed keywords

ALIGNED CARBON NANOTUBES; CARBON NANOTUBE SYNTHESIS; COBALT DISILICIDE; COMPATIBLE MATERIALS; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CONDUCTIVE SUBSTRATES; CONVENTIONAL CATALYST; DEEP HOLES; ELECTRICALLY CONDUCTIVE; FORMATION METHOD; FORMATION PROCESS; HYDROGEN REDUCTION; INTERCONNECT DEVICES; METAL CATALYST; REACTIVE ION ETCH; SELF-ALIGNED; VERTICAL SURFACE;

EID: 84859530374     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3694678     Document Type: Article
Times cited : (14)

References (51)
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    • Qi, H.1    Qian, C.2    Liu, J.3
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    • XPS fitting parameters: For Co metal at 778.3 eV: Gaussian width (G) 0.8eV, Lorentzian width (L) 0.44 eV, asymmetry factor is 0.15. For cobalt silicide at 778.9 eV: G 1.2 eV, L 0.25 eV. For cobalt fluoride for the peak at 783.2 eV: G 1.6 eV, L 0.5 eV and for the peak at 781.45 eV: G 1.55 eV, L 0.5 eV. For F at 685.2 eV: G 1.6 eV, L 0.25 eV
    • XPS fitting parameters: For Co metal at 778.3 eV: Gaussian width (G) 0.8eV, Lorentzian width (L) 0.44 eV, asymmetry factor is 0.15. For cobalt silicide at 778.9 eV: G 1.2 eV, L 0.25 eV. For cobalt fluoride for the peak at 783.2 eV: G 1.6 eV, L 0.5 eV and for the peak at 781.45 eV: G 1.55 eV, L 0.5 eV. For F at 685.2 eV: G 1.6 eV, L 0.25 eV.
  • 43
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    • Z. J. Han and K. Ostrikov, Appl. Phys. Lett. 96, 233115-233117 (2010). 10.1063/1.3449118
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    • Han, Z.J.1    Ostrikov, K.2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.