Improvement of the tracking accuracy of an AFM using MPC

Proceedings of the 2013 IEEE 8th Conference on Industrial Electronics and Applications, ICIEA 2013

Volumn , Issue , 2013, Pages 1681-1686

  Rana, M S ^a   Pota, H R ^a   Petersen, I R ^a   Habibullah, ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE TRACKING; ATOMIC FORCE MICROSCOPE (AFM); CONTROL SCHEMES; DIFFERENT REFERENCE SIGNALS; EXPERIMENTAL COMPARISON; REFERENCE SIGNALS; SCANNING RATE; TRACKING ACCURACY;

ATOMIC FORCE MICROSCOPY; INDUSTRIAL ELECTRONICS; MODEL PREDICTIVE CONTROL; SIGNAL PROCESSING;

PREDICTIVE CONTROL SYSTEMS;

EID: 84881424965     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIEA.2013.6566639     Document Type: Conference Paper

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