Characterization of sample preparation methods of NIH/3T3 fibroblasts for ToF-SIMS analysis

Biointerphases

Volumn 8, Issue 1, 2013, Pages 1-12

  Robinson, Michael A ^a,b   Castner, David G ^a,b,c  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c University of Washington   (United States)

Author keywords

Cells; Depth profile; Sample preparation; ToF SIMS

Indexed keywords

CELL CULTURE; CELL MEMBRANES; CELLS; CHEMICAL ANALYSIS; DEPTH PROFILING; FORMALDEHYDE; HYDRATION; NEGATIVE IONS; ORGANIC POLYMERS; SALTS; SECONDARY EMISSION;

DAMAGE CROSS-SECTION; PRESENCE OF WATER; SAMPLE PREPARATION; SAMPLE PREPARATION METHODS; SECONDARY ION YIELD; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TOF-SIMS ANALYSIS;

SECONDARY ION MASS SPECTROMETRY;

3T3 CELL LINE; ANIMAL; CYTOLOGY; FIBROBLAST; MOUSE; PROCEDURES; SECONDARY ION MASS SPECTROMETRY;

ANIMALS; FIBROBLASTS; MICE; NIH 3T3 CELLS; SPECTROMETRY, MASS, SECONDARY ION;

EID: 84881224523     PISSN: 19348630     EISSN: 15594106     Source Type: Journal    
DOI: 10.1186/1559-4106-8-15     Document Type: Article

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