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Volumn 43, Issue 1-2, 2011, Pages 261-264
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Comparison of Bi1+, Bi3+ and C60+ primary ion sources for ToF-SIMS imaging of patterned protein samples
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Author keywords
depth profile; image contrast; principal component analysis; surface analysis; ToF SIMS imaging
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Indexed keywords
DEPTH PROFILE;
FLUENCES;
FRAGMENTATION PATTERNS;
IMAGE CONTRASTS;
ION FLUENCES;
ION IMAGES;
LOW MASS;
PRINCIPAL COMPONENTS;
PROTEIN FRAGMENTS;
PROTEIN LAYERS;
PROTEIN SAMPLES;
STATIC LIMITS;
SURFACE SENSITIVITY;
TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;
TOF-SIMS IMAGING;
ETHYLENE;
ETHYLENE GLYCOL;
ION SOURCES;
IONS;
POLYETHYLENE GLYCOLS;
POLYETHYLENE OXIDES;
POLYMER FILMS;
PROTEINS;
SECONDARY ION MASS SPECTROMETRY;
SURFACE ANALYSIS;
PRINCIPAL COMPONENT ANALYSIS;
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EID: 78951476074
PISSN: 01422421
EISSN: 10969918
Source Type: Journal
DOI: 10.1002/sia.3537 Document Type: Conference Paper |
Times cited : (26)
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References (16)
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