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Volumn 43, Issue 1-2, 2011, Pages 261-264

Comparison of Bi1+, Bi3+ and C60+ primary ion sources for ToF-SIMS imaging of patterned protein samples

Author keywords

depth profile; image contrast; principal component analysis; surface analysis; ToF SIMS imaging

Indexed keywords

DEPTH PROFILE; FLUENCES; FRAGMENTATION PATTERNS; IMAGE CONTRASTS; ION FLUENCES; ION IMAGES; LOW MASS; PRINCIPAL COMPONENTS; PROTEIN FRAGMENTS; PROTEIN LAYERS; PROTEIN SAMPLES; STATIC LIMITS; SURFACE SENSITIVITY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF-SIMS IMAGING;

EID: 78951476074     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3537     Document Type: Conference Paper
Times cited : (26)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.