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Volumn 34, Issue 8, 2013, Pages 996-998

Current compliance-dependent nonlinearity in TiO2 ReRAM

Author keywords

MOSFET; nonlinearity; RESET; resistive RAM (ReRAM); SET; TiO2

Indexed keywords

MOS-FET; NONLINEARITY; RESET; RESISTIVE RAMS (RERAM); SET; TIO;

EID: 84880980259     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2013.2265715     Document Type: Article
Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.