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Volumn 114, Issue 1, 2013, Pages

Kelvin probe force microscopy and electrostatic force microscopy responses to the polarization in a ferroelectric thin film: Theoretical and experimental investigations

(1) Cuniot Ponsard, M a

a UNIV PARIS SUD (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC FORCE MICROSCOPY; INHOMOGENEOUS ELECTRIC FIELDS; KELVIN PROBE FORCE MICROSCOPY; MACROSCOPIC AND MICROSCOPIC; QUANTITATIVE INFORMATION; SIGNIFICANT DIFFERENCES; STRONTIUM BARIUM NIOBATE; THEORETICAL AND EXPERIMENTAL;

DENSE WAVELENGTH DIVISION MULTIPLEXING; ELECTRIC FIELDS; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; FILM PREPARATION; PLATINUM; PROBES;

POLARIZATION;

EID: 84880869796 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4812393 Document Type: Article

Times cited : (13)

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