Electromechanical tuning of nanoscale MIM diodes by nanoindentation

Journal of Materials Research

Volumn 28, Issue 14, 2013, Pages 1912-1919

  Periasamy, Prakash ^a   Bradley, Michael Scott ^a   Parilla, Philip A ^b   Berry, Joseph J ^b   Ginley, David S ^b   O'Hayre, Ryan P ^a   Packard, Corinne E ^a,b  

^a Department of Metallurgical and Materials Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE-ATOMIC FORCE; ELECTRICAL TESTING; ELECTRONIC TUNNELING; EQUIVALENT CURRENTS; INDENTATION DEPTH; METAL INSULATOR METALS; SIMULTANEOUS MEASUREMENT; VERY HIGH FREQUENCY;

ATOMIC FORCE MICROSCOPY; DIODES; DISSIMILAR METALS; METAL INSULATOR BOUNDARIES; NANOTECHNOLOGY; TESTING; TUNING;

MIM DEVICES;

EID: 84880524843     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2013.171     Document Type: Article

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