Optical rectification and field enhancement in a plasmonic nanogap

Nature Nanotechnology

Volumn 5, Issue 10, 2010, Pages 732-736

  Ward, Daniel R ^a   HÜser, Falco ^b   Pauly, Fabian ^b   Cuevas, Juan Carlos ^c   Natelson, Douglas ^a,d  

^a RICE UNIVERSITY   (United States)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^d Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTROMAGNETIC FIELDS; NANOPHOTONICS; NANOSTRUCTURES; PLASMONICS; PLASMONS; SEMICONDUCTOR QUANTUM WELLS;

CONDUCTION MEASUREMENT; ELECTROMAGNETIC RESPONSE; FREE-SPACE WAVELENGTHS; INCIDENT POLARIZATION; OPTICAL RECTIFICATIONS; SURFACE ENHANCED RAMAN; SURFACE ENHANCED SPECTROSCOPY; THEORETICAL APPROACH;

NONLINEAR OPTICS;

NANOMATERIAL;

ARTICLE; COMPARATIVE STUDY; DIRECT CURRENT; ELECTRIC FIELD; ELECTROMAGNETIC FIELD; ILLUMINATION; MEASUREMENT; NANOFABRICATION; NANOTECHNOLOGY; OPTICS; POLARIZATION; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SPECTROSCOPY; SURFACE PROPERTY;

EID: 77957910560     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2010.176     Document Type: Article

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