Fabrication and characterization of MIM diodes based on Nb/Nb 2O 5 via a rapid screening technique

Advanced Materials

Volumn 23, Issue 27, 2011, Pages 3080-3085

  Periasamy, Prakash ^b   Berry, Joseph J ^a   Dameron, Arrelaine A ^a   Bergeson, Jeremy D ^a   Ginley, David S ^a   O'Hayre, Ryan P ^b   Parilla, Philip A ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Department of Metallurgical and Materials Engineering   (United States)

Author keywords

anodic oxidation; metal insulator metal structures; MIM diodes; Nb Nb 2O 5; rectenna

Indexed keywords

FACILE FABRICATION; METAL INSULATOR METALS; METAL-INSULATOR-METAL STRUCTURES; MIM DIODES; NON-LINEARITY; RAPID SCREENING; RECTENNAS; ULTRA-FAST;

ANODIC OXIDATION; DIODES; METAL INSULATOR BOUNDARIES; METALS; PLATINUM; SEMICONDUCTOR INSULATOR BOUNDARIES;

MIM DEVICES;

METAL; NIOBIUM; NIOBIUM PENTOXIDE; OXIDE; SILICON;

ARTICLE; CHEMISTRY; ELECTRONICS; INSTRUMENTATION; OXIDATION REDUCTION REACTION;

ELECTRONICS; METALS; NIOBIUM; OXIDATION-REDUCTION; OXIDES; SILICON;

EID: 79960460456     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201101115     Document Type: Article

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