Measurement and uncertainty analysis of a cryogenic low-noise amplifier with noise temperature below 2 K

Radio Science

Volumn 48, Issue 3, 2013, Pages 344-351

  Gu, Dazhen ^a,b   Randa, James ^a,c   Billinger, Robert ^a   Walker, David K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Colorado at Boulder   (United States)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

low noise amplifier; measurement; uncertainty analysis

Indexed keywords

CRYOGENICS; HIGH ELECTRON MOBILITY TRANSISTORS; III-V SEMICONDUCTORS; INDIUM PHOSPHIDE; LOW NOISE AMPLIFIERS; MEASUREMENT; MICROWAVE AMPLIFIERS; SEMICONDUCTING INDIUM PHOSPHIDE;

CHARACTERIZATION METHODS; CRYOGENIC LOW NOISE AMPLIFIERS; MEASUREMENT ACCURACY; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; NOISE PERFORMANCE; NOISE TEMPERATURE; PHYSICAL TEMPERATURE; PRECISION MEASUREMENT;

UNCERTAINTY ANALYSIS;

EID: 84880385458     PISSN: 00486604     EISSN: 1944799X     Source Type: Journal    
DOI: 10.1002/rds.20039     Document Type: Article

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