A novel wide-band noise-parameter measurement method and its cryogenic application

IEEE Transactions on Microwave Theory and Techniques

Volumn 52, Issue 5, 2004, Pages 1498-1507

  Hu, Robert ^a   Weinreb, Sander ^b  

^a ACADEMIA SINICA   (Taiwan)

^b California Institute of Technology   (United States)

Author keywords

Frequency variation method; Noise parameter measurement

Indexed keywords

AMPLIFIERS (ELECTRONIC); BANDWIDTH; COMPUTER SIMULATION; ELECTRIC IMPEDANCE; ELECTRIC LINES; ELECTROMAGNETIC WAVE REFLECTION; ERROR ANALYSIS; LEAST SQUARES APPROXIMATIONS; LOW TEMPERATURE PHENOMENA; SPURIOUS SIGNAL NOISE;

FREQUENCY RANGE; FREQUENCY-VARIATION METHOD; LOW-NOISE AMPLIFIERS (LNA); NOISE-PARAMETER MEASUREMENT;

BROADBAND NETWORKS;

EID: 2542493065     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.827029     Document Type: Article

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