Ultra-wideband chip attenuator for precise noise measurements at cryogenic temperatures

IEEE Transactions on Microwave Theory and Techniques

Volumn 58, Issue 9, 2010, Pages 2504-2510

  Cano, Juan Luis ^a   Wadefalk, Niklas ^b   Gallego Puyol, Juan Daniel ^c  

^a UNIVERSITY OF CANTABRIA   (Spain)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c Centro Astronomico de Yebes   (Spain)

Author keywords

Attenuators; cold attenuator technique; cryogenics; noise measurement; Y factor method

Indexed keywords

ATTENUATORS; CHIP SUBSTRATES; COLD-ATTENUATOR TECHNIQUE; CRYOGENIC TEMPERATURES; CRYSTAL QUARTZ; ELECTRICAL PERFORMANCE; FREQUENCY RANGES; HIGH THERMAL CONDUCTIVITY; HIGH-ACCURACY; INSERTION LOSS CHANGES; LIMITING FACTORS; MEASUREMENT ACCURACY; NOISE MEASUREMENTS; RESISTIVE ELEMENTS; RETURN LOSS; TEMPERATURE CHARACTERIZATION; TEMPERATURE GRADIENT; TEMPERATURE STABILITY; TEMPERATURE STABLE; THERMAL HEATING; THIN FILM RESISTORS; Y-FACTOR METHOD;

ACOUSTIC NOISE MEASUREMENT; BANDPASS FILTERS; QUARTZ; SENSORS; THERMAL CONDUCTIVITY; THERMAL CONDUCTIVITY OF SOLIDS; THERMOANALYSIS;

CRYOGENICS;

EID: 77956614733     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2010.2058276     Document Type: Article

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