Development of Accurate On-Wafer, Cryogenic Characterization Techniques

IEEE Transactions on Microwave Theory and Techniques

Volumn 44, Issue 7 PART 1, 1996, Pages 1178-1183

  Laskar, J ^a   Bautista, J J ^b   Nishimoto, M ^c   Iiamai, M ^c   Lai, R ^a,b,c  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CALIBRATION; CRYOGENICS; ELECTROMAGNETIC WAVE SCATTERING; MICROWAVE MEASUREMENT; OPTIMIZATION; PERFORMANCE; SEMICONDUCTOR DEVICE STRUCTURES; SPURIOUS SIGNAL NOISE;

LOW NOISE AMPLIFIERS; QUANTUM NOISE LIMIT; SCATTERING PARAMETER MEASUREMENT SYSTEM;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0030195412     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.508659     Document Type: Article

References (23)

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