A verification method for noise-temperature measurements on cryogenic low-noise amplifiers

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2012, Pages 32-33

  Gu, Dazhen ^a,b   Randa, James ^a,c   Billinger, Robert ^a   Walker, David K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Colorado at Boulder   (United States)

^c UNIVERSITY OF COLORADO   (United States)

Author keywords

Cryogenic amplifier; measurement uncertainty; noise measurement; noise temperature; verification methods

Indexed keywords

CRYOGENIC AMPLIFIER; MEASUREMENT UNCERTAINTY; NOISE MEASUREMENTS; NOISE TEMPERATURE; VERIFICATION METHOD;

CRYOGENICS; ELECTROMAGNETISM; LIQUEFIED GASES; SUPERFLUID HELIUM; TEMPERATURE MEASUREMENT; UNCERTAINTY ANALYSIS;

LOW NOISE AMPLIFIERS;

EID: 84866789636     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2012.6250644     Document Type: Conference Paper

References (3)

1. J. Randa, E. Gerecht, Dazhen Gu, and R. L. Billinger, "Precision measurement method for cryogenic amplifier noise temperatures below 5 K," IEEE Trans. Microw. Theory Tech., vol. 54, no. 3, pp. 1180-1189, Mar. 2006.
2. J. Randa, J. Dunsmore, Dazhen Gu, et al., "Verification of Noise-Parameter Measurements and Uncertainties," IEEE Trans. Instrum. Meas., vol. 60, no. 11, pp. 3685-3693, Nov. 2011.
3. D. M. Pozar, Microwavewave Engineering (3rd edn.), pp. 653, Hoboken, NJ: John Wiley & Sons, 2004.