Cryogenic self-calibrating noise parameter measurement system

IEEE Transactions on Microwave Theory and Techniques

Volumn 60, Issue 5, 2012, Pages 1456-1467

  Russell, Damon ^a   Weinreb, Sander ^a  

^a California Institute of Technology   (United States)

Author keywords

Low noise amplifiers (LNAs); noise; noise measurement

Indexed keywords

COUPLING NETWORK; CRYOGENIC TEMPERATURES; DISCRETE TRANSISTORS; FREQUENCY RANGES; INDEPENDENT MEASUREMENT; NOISE; NOISE MEASUREMENTS; NOISE PARAMETERS; NOISE SOURCE; SELF-CALIBRATING; THEORETICAL VALUES; THERMAL CALIBRATION; WIDE-BAND;

BROADBAND AMPLIFIERS; CALIBRATION; DIGITAL INTEGRATED CIRCUITS;

LOW NOISE AMPLIFIERS;

EID: 84860676822     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2012.2188813     Document Type: Conference Paper

References (14)

1. R. Q. Lane, "The determination of device noise parameters," Proc. IEEE, vol. 57, no. 8, pp. 1461-1462, Aug. 1969.
2. D. Gu, D. Walker, and J. Randa, "Noise-parameter measurements with automated variable terminations," IEEE Trans. Instrum. Meas., vol. 58, no. 4, pp. 1072-1077, Apr. 2009.
3. R. Hu and S. Weinreb, "A novel wideband noise-parameter measurement method and its cryogenic application," IEEE Trans. Microw. Theory Tech., vol. 52, no. 5, pp. 1498-1506, May 2004.
4. G. Vasilescu and G. Alquie, "Accuracy improvements in microwave transistor noise parameter extraction," in Proc. Int. Semiconductor Conf., Sinaia, Romania, 1997, vol. 2, pp. 361-364.
5. H. Nyquist, "Thermal agitation of electric charge in conductors," Phys. Rev., vol. 32, no. 1, pp. 110-113, Jul. 1928.
6. M. Pospieszalski, "Interpreting transistor noise," IEEE Microwave, vol. 11, no. 6, pp. 62-69, Oct. 2010.
7. J. Bardin, "Silicon-germanium heterojunction bipolar transistors for extremely low-noise applications," Ph.D. dissertation, Dept. Elect. Eng., Cal. Inst. Technol., Pasadena, CA, 2009.
8. J. Lange, "Noise characterization of linear twoports in terms of invariant parameters," IEEE J. Solid-State Circuits, vol. SSC-2, no. 2, pp. 37-40, Jun. 1967.
9. S. Weinreb, J. Bardin, H. Mani, and G. Jones, "Matched wideband low-noise amplifiers for radio-astronomy," Rev. Sci. Instrum., vol. 80, no. 5, pp. 44702-44705, Apr. 2009.
10. J. Gallego and M. Pospieszalski, "Accuracy of noise temperature measurement of cryogenic amplifiers," Nat. Radio Astron. Observatory, Charlottesville, VA, Eletron. Div. Internal Rep. 285, 1991.
11. G. Fernandez, "A noise-temperature measurement system using a cryo genic attenuator," Jet Propulsion Lab., Pasadena, CA, TMO Progress Rep. 42-135, 1998.
12. D. Russell and S. Weinreb, "Low power, very low noise, cryogenic SiGe IF amplifiers for THz mixer receivers," IEEE Trans. Microw. Theory Tech., accepted for publication.
13. D. Pozar, "Radiometry," in Microwave Engineering. New York: Wiley, 1998, ch. 12, sec. 12.4, pp. 681-683.
14. P. Bevington and D. Robinson, "Error analysis," in Data Reduction and Error Analysis for the Physical Sciences. New York: McGraw-Hill, 2003, ch. 3, sec. 1-3, pp. 36-46.