Damage mechanisms in electron microscopy of insulating materials

Journal of Physics D: Applied Physics

Volumn 46, Issue 30, 2013, Pages

  Jiang, Nan ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; ELECTRIC FIELD INDUCED; FOCUSED ELECTRON BEAMS; INDUCED ELECTRIC FIELDS; INORGANIC MATERIALS; MICROSCOPIC ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SPECIMEN THICKNESS;

ATOMS; ELECTRON BEAMS; PHASE SEPARATION; PROBES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC FIELDS;

EID: 84880220326     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/46/30/305502     Document Type: Article

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