Can we trust TEM images of silicate glasses?

Materials Research Society Symposium - Proceedings

Volumn 792, Issue , 2003, Pages 223-227

  Jiang, Nan ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRON IRRADIATION; GRINDING (COMMINUTION); IMAGE ANALYSIS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PHASE SEPARATION; PRECIPITATION (CHEMICAL); REMOVAL; SURFACE PHENOMENA; TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DARK FIELD (ADF); BEAM-GLASS INTERACTION; GLASS SYSTEMS; PHASE DECOMPOSITION;

BOROSILICATE GLASS;

EID: 2442503648     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-792-r10.2     Document Type: Conference Paper

References (9)

1. W. J. Weber, R. C. Ewing, C. A. Angell, G. W. Arnold, A. N. Cormack, J. M. Delaye, D. L. Griscom, L. W. Hobbs, A. Navrotsky, D. L. Price, A. M. Stoneham, and M. C. Weinberg, J. Mater. Res. 12, 1946 (1997).
2. E. Kirkland, Ultramicroscopy 32, 349 (1990).
3. N. Jiang, J. Qiu, A. L. Gaeta, J. Silcox, Appl. Phys. Lett. 80, 2005 (2002).
4. N. Jiang, J. Qiu, and J. Silcox, Appl. Phys Lett. 77, 3956 (2000).
5. N. Jiang and J. Silcox, J. Appl. Phys. 92, 2310 (2002).
6. N. Jiang, J. Qiu, A. Ellison, and J. Silcox, Phys. Rev. B 68, 064207 (2003).
7. Y. H. Yun and P. J. Bray, J. Non-Cryst. Solids 27, 363 (1978).
8. J. Cazaux, Ultramicroscopy 60, 411 (1995).
9. N. Jiang and J. Silcox, submitted to J. Non-Cryst. Solids (unpublished).