Do Eu dopants prefer the precipitated LaF3 nanocrystals in glass ceramics?

Physica Status Solidi - Rapid Research Letters

Volumn 6, Issue 12, 2012, Pages 487-489

  Jiang, Nan ^a   Zhou, Shifeng ^b   Su, Dong ^c   Qiu, Jianrong ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b ZHEJIANG UNIVERSITY   (China)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Doping; Fluorides; LaF3; Nanocrystals; Rare earth; Silicate glasses

Indexed keywords

ELECTRON-BEAM EXPOSURE; EXPERIMENTAL CONDITIONS; EXPOSURE-TIME; FLUORIDE NANOCRYSTALS; FLUORIDES; GLASS MATRICES; LAF3; RARE-EARTH DOPANTS; SILICATE GLASS; TRANSMISSION ELECTRON MICROSCOPY TEM;

DOPING (ADDITIVES); ELECTRON BEAM LITHOGRAPHY; FLUORINE COMPOUNDS; GLASS CERAMICS; NANOCRYSTALS; SILICATES; TRANSMISSION ELECTRON MICROSCOPY;

EUROPIUM;

EID: 84870977083     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201206476     Document Type: Article

References (20)

1. G. H. Beall and L. R. Pinckney, J. Am. Ceram. Soc. 82, 5-16 (1999).
2. Y. Wang and J. Ohwaki, Appl. Phys. Lett. 63, 3268 (1993).
3. B. N. Samson, P. A. Tick, and N. F. Borrelli, Opt. Lett. 26, 145 (2001).
4. K. Driesen, V. K. Tikhomirov, C. Görller-Walrand, V. D. Rodriguez, and A. B. Seddon, Appl. Phys. Lett. 88, 073111 (2006).
5. D. Chen, Y. Yu, P. Huang, H. Lin, Z. Shan, Y. Wang, Acta Mater. 58, 3035 (2010).
6. S. Zhou, N. Jiang, K. Miura, S. Tanabe, M. Shimizu, M. Sakakura, Y. Shimotusuma, M. Nishi, J. Qiu, and K. Hirao, J. Am. Chem. Soc. 132, 17945 (2010).
7. F. Lahoz, I. R. Martín, J. Méndez-Ramos, and P. Núñez, J. Phys. Chem. 120, 6180 (2004).
8. X. Fan, J. Wang, X. Qiao, M. Wang, J. Adam, and X. Zhang, J. Phys. Chem. B 110, 5950 (2006).
9. G. Dantelle, M. Mortier, D. Vivien, and G. Patriarche, Chem. Mater. 17, 2216 (2005).
10. C. Liu and J. Heo, J. Am. Ceram. Soc. 95, 2100 (2012).
11. D. Chen, Y. Wang, Y. Yu, P. Huang, and F. Weng, Opt. Lett. 33, 1884 (2008).
12. X. Qiao, X. Fan, Z. Xue, X. Xu, and Q. Luo, J. Lumin. 131, 2036 (2011).
13. H. Inada, L. Wu, J. Wall, D. Su, and Y. Zhu, J. Electron Microsc. 58, 111 (2009).
14. N. Jiang, J. Non-Cryst. Solids 358, 119 (2011).
15. J. Cazaux, Ultramicroscopy 60, 411 (1995).
16. N. Jiang and J. Silcox, J. Appl. Phys. 92, 2310 (2002).
17. N. Jiang, Micron 43, 746 (2012).
18. N. Jiang and S. Ye, submitted to Nucl. Instrum. Methods B (2012).
19. D. J. Smith, M. R. McCartney, and L. A. Bursall, Ultramicroscopy 23, 299 (1987).
20. V. K. Tikhomirov, G. Adamo, A. E. Nikolaenko, V. D. Rodriguez, P. Gredin, M. Mortier, N. I. Zheludev, and V. V. Moshchalkov, Opt. Express 18, 8836 (2010).